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@BOOK{Li:95292,
      author       = {Liß, Klaus-Dieter},
      title        = {{S}trukturelle {C}harakterisierung und {O}ptimierung der
                      {B}eugungseigenschaften von ${S}i_{1-x}$ ${G}e_x$
                      {G}radientenkristallen, die aus der {G}asphase gezogen
                      wurden},
      address      = {Aachen},
      reportid     = {RWTH-CONV-106459},
      year         = {2001},
      note         = {Urspr. ersch. als Druckausgabe, Aachen, 1994; Zugl.:
                      Aachen, Techn. Hochsch., Diss., 1994},
      abstract     = {Two theoretical models for the description of the
                      diffraction properties of gradient crystals have been
                      developed, one in the framework of the kinematical theory,
                      the other within a transfer matrix formalism based on the
                      dynamical theory of diffraction. The former gives analytical
                      results which are well suited to describe the widths as well
                      the characteristic oscillations of the diffraction curves
                      while the second delivers the exact, extinction limited
                      intensity distributions. A matrix describes the coupling and
                      the propagations of the forward- and the Bragg-diffracted
                      wave functions through a plane, parallel crystal lamella. It
                      applies for the description of any crystalline medium with
                      changes of the diffraction properties along the direction of
                      the surface normal. Experimentally a crystal growth
                      technique has been set up to produce novel Si1-xGex gradient
                      crystals with 0 < x < 0.4 on a large surface and with growth
                      rates of up to 0.6 µm/min. Layer thicknesses of several 100
                      µm have been achieved. The structure has been characterized
                      by visual microscopy, electron microscopy, micro probe
                      analysis and by their diffraction properties. The latter
                      deliver both, the mosaic distribution and the lattice
                      parameter broadening due to the gradient. In particular a
                      tetragonal distortion attributed to different thermal
                      expansion coefficients has been discovered. The anisotrope
                      mosaic distribution gives evidences for the existence of
                      misfit dislocations. The reflection curves calculated by the
                      transfer matrix method fit well the experimental results.
                      With the application for a neutron monochromator in mind,
                      the diffraction data show an intensity increase of 25
                      related to the experimental resolution function. Comparing
                      this value with the calculated reflectivity for perfect
                      silicon, this factor increases to 40. For compromise of
                      feasibility, however, the gradients have been grown too
                      rapid, such that the maximal reflectivity of 100 $\%$ has
                      not yet been achieved. In the present example, the widening
                      of the lattice parameter is 70 times the natural line width
                      of ideal silicon and has been pushed with Dd/d = 1.4·10-2
                      to the 700 fold value.},
      cin          = {100000},
      ddc          = {540},
      cid          = {$I:(DE-82)100000_20140620$},
      typ          = {PUB:(DE-HGF)3},
      urn          = {urn:nbn:de:hbz:82-opus-2227},
      url          = {https://publications.rwth-aachen.de/record/95292},
}