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@PHDTHESIS{KarimiAghda:961005,
      author       = {Karimi Aghda, Soheil},
      othercontributors = {Schneider, Jochen M. and Anders, Andre},
      title        = {{I}nfluence of point defects on the elastic properties and
                      phase stability of cubic binary and ternary transition metal
                      (aluminum) nitride thin films},
      volume       = {41},
      school       = {Rheinisch-Westfälische Technische Hochschule Aachen},
      type         = {Dissertation},
      address      = {Aachen},
      publisher    = {RWTH Aachen University},
      reportid     = {RWTH-2023-06577},
      series       = {Materials chemistry dissertation},
      pages        = {1 Online-Ressource : Illustrationen, Diagramme},
      year         = {2023},
      note         = {Veröffentlicht auf dem Publikationsserver der RWTH Aachen
                      University; Dissertation, Rheinisch-Westfälische Technische
                      Hochschule Aachen, 2023},
      abstract     = {In the first part of this thesis, a correlative
                      experimental and theoretical model is developed to study the
                      influence of ion kinetic energy on the evolution of point
                      defect structure in metastable cubic (V,Al)N. Ion
                      irradiation-induced changes in the structure and mechanical
                      properties of (V,Al)N thin films deposited by reactive high
                      power pulsed magnetron sputtering (HPPMS) are systematically
                      investigated in the ion kinetic energy $(E_k)$ range from 4
                      to 154 eV. Increasing $E_k$ results in film densification
                      and the evolution from a columnar (111) oriented structure
                      at $E_k$ ≤ 24 eV to a fine-grained structure with (100)
                      preferred orientation for $E_k$ ≥ 104 eV. Furthermore, the
                      compressive intrinsic stress increases by 336 $\%$ to −4.8
                      GPa as $E_k$ is increased from 4 to 104 eV. Higher ion
                      kinetic energy causes stress relaxation to −2.7 GPa at 154
                      eV. These ion irradiation-induced changes in the thin film
                      stress state are in good agreement with density functional
                      theory (DFT) simulations. Furthermore, the measured elastic
                      moduli of (V,Al)N thin films exhibit no significant
                      dependence on $E_k.$ The apparent independence of the
                      elastic modulus on $E_k$ can be rationalized by considering
                      the concurrent and balancing effects of bombardment-induced
                      formation of Frenkel pairs (causing a decrease in elastic
                      modulus) and evolution of compressive intrinsic stress
                      (causing an increase in elastic modulus). Hence, the
                      evolution of the film stresses and mechanical properties can
                      be understood based on the complex interplay of ion
                      irradiation-induced defect generation and annihilation. In
                      the second part, the developed model was extended towards
                      the isostructural (Ti,Al)N thin films grown by two physical
                      vapor deposition techniques, namely HPPMS and cathodic arc
                      deposition (CAD). Ion irradiation-induced changes in
                      structure, elastic properties, and thermal stability of
                      metastable cubic (Ti,Al)N thin films are systematically
                      investigated by experiments and DFT simulations. While thin
                      films deposited by HPPMS show a random orientation at $E_k$
                      > 105 eV, an evolution towards (111) orientation is observed
                      in CAD thin films for $E_k$ > 144 eV. The measured ion
                      energy flux at the growing film surface is 3.3 times larger
                      for CAD as compared to HPPMS. Hence, it is inferred that the
                      formation of the strong (111) texture in CAD thin films is
                      caused by the ion flux- and ion energy-induced minimization
                      of strain energy in defective cubic (Ti,Al)N. The ion
                      energy-dependent elastic modulus can be rationalized by
                      considering the ion energy- and orientation-dependent
                      formation of point defects from DFT predictions: The
                      balancing effects of bombardment-induced formation of
                      Frenkel defects and the concurrent evolution of compressive
                      intrinsic stress result in the apparent independence of the
                      elastic modulus from $E_k$ for HPPMS thin films without
                      preferential orientation, similar to the previously
                      investigated (V,Al)N. However, an ion energy-dependent
                      elastic modulus reduction of $~18\%$ for the CAD thin films
                      can be understood by considering the $34\%$ higher Frenkel
                      pair concentration formed at $E_k$ = 182 eV upon irradiation
                      of the experimentally observed (111) oriented (Ti,Al)N in
                      comparison to the (200) configuration at a similar $E_k$
                      magnitude. Moreover, the effect of Frenkel pair
                      concentration on the thermal stability of metastable
                      (Ti,Al)N is investigated by differential scanning
                      calorimetry for both processing routes: The ion
                      irradiation-induced increase in Frenkel pairs concentration
                      retards the wurtzite formation temperature by up to 206 °C.
                      In the third and last part, the elastic response of binary
                      cubic transition metal nitrides (c-TMNs) with respect to the
                      occupancy of non-metal sublattice is explored. Motivated by
                      the frequently reported deviations from stoichiometry in
                      c-TMNs, the effect of nitrogen vacancy concentration on the
                      elastic properties of TiNx, ZrNx, VNx, NbNx, and MoNx (0.72
                       x  1.00) is systematically studied by DFT. The
                      predictions are validated experimentally for VNx (0.75  x
                       0.96). The DFT results clearly indicate a different
                      elastic response of the group IV, V, and VI nitrides with
                      respect to N vacancy concentration. While, TiNx and ZrNx
                      exhibit vacancy-induced reduction in elastic modulus, an
                      elastic modulus enhancement is obtained for VNx and NbNx.
                      These trends could be rationalized by analyzing the bonding
                      characteristic of the binary compounds. The integrated
                      crystal orbital Hamilton population calculations indicate a
                      lower bond strength of Ti–N for TiNx due to presence of N
                      vacancies. However, presence of N vacancies in VNx results
                      in a higher bond strength of V–N, which consequently leads
                      to an overall anomalous increase in elastic modulus of VNx.
                      To validate the elastic modulus behavior with respect to N
                      vacancy concentration experimentally, high crystalline
                      quality, close to single-crystal, VNx thin films are grown
                      on single crystal MgO(001) substrates. Reduction of N
                      content in VNx/MgO(001) from x = 0.96 ± 0.05 to 0.75 ±
                      0.04 leads to a decrease in the relaxed lattice parameter a0
                      from 4.128 Å to 4.096 Å, respectively. This reduction in
                      lattice parameter is accompanied by an anomalous $11\%$
                      increase in elastic modulus. These results are in agreement
                      with the theoretically calculated elasticity data for VNx,
                      which is attributed to vacancy-induced bond strengthening.
                      The results of this thesis pave the way for the design and
                      tailoring of hard protective coatings by considering
                      plasma-surface interactions on the atomistic level. The
                      combination of DFT simulations and growth experiments
                      allowed us to understand the role of plasma condition
                      variation, specifically ion kinetic energy, on the point
                      defect structure and its implications for mechanical
                      properties and thermal stability of nitride thin films.},
      cin          = {521110 / 520000},
      ddc          = {620},
      cid          = {$I:(DE-82)521110_20140620$ / $I:(DE-82)520000_20140620$},
      pnm          = {DFG project 138690629 - TRR 87: Gepulste
                      Hochleistungsplasmen zur Synthese nanostrukturierter
                      Funktionsschichten (138690629)},
      pid          = {G:(GEPRIS)138690629},
      typ          = {PUB:(DE-HGF)11 / PUB:(DE-HGF)3},
      doi          = {10.18154/RWTH-2023-06577},
      url          = {https://publications.rwth-aachen.de/record/961005},
}