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000962553 0247_ $$2doi$$a10.1109/LATS58125.2023.10154503
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000962553 041__ $$aEnglish
000962553 1001_ $$0P:(DE-82)IDM04616$$aSantos Copetti, Thiago$$b0$$eCorresponding author$$urwth
000962553 1112_ $$aIEEE 24. Latin American Test Symposium$$cVeracruz$$d2023-03-21 - 2023-03-24$$gLATS 2023$$wMexico
000962553 245__ $$aEvaluating a New RRAM Manufacturing Test Strategy$$honline, print
000962553 260__ $$a[Piscataway, NJ]$$bIEEE$$c2023
000962553 29510 $$a24th IEEE Latin American Test Symposium : Veracruz, Mexico, 21st-24th March 2023 / LATS 2023 ; general chair: Victor Champac (INAOE, Mexico), Yervant Zorian (Synopsys, USA) ; publication chair: Tiago Balen (UFRGS, Brazil) ; publisher: IEEE
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000962553 536__ $$0G:(DE-82)EXS-SF-StUpPD_425-22$$aStUpPD_425-22 - Study of Memristive Devices' Reliability considering PV and Operating Conditions (EXS-SF-StUpPD_425-22)$$cEXS-SF-StUpPD_425-22$$x0
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000962553 591__ $$aGermany
000962553 7001_ $$aCastelnuovo, A.$$b1$$eCorresponding author
000962553 7001_ $$0P:(DE-82)IDM01616$$aGemmeke, Tobias$$b2$$eCorresponding author$$urwth
000962553 7001_ $$0P:(DE-82)820257$$aBolzani Pöhls, Letícia$$b3$$eCorresponding author$$urwth
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000962553 9141_ $$y2023
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