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@PHDTHESIS{Qiu:973466,
      author       = {Qiu, Depeng},
      othercontributors = {Rau, Uwe and Vescan, Andrei},
      title        = {{D}evelopment of industry-scalable processes for
                      nanocrystalline silicon oxide in silicon heterojunction
                      solar cells},
      volume       = {619},
      school       = {RWTH Aachen University},
      type         = {Dissertation},
      address      = {Jülich},
      publisher    = {Forschungszentrum Jülich GmbH, Zentralbibliothek, Verlag},
      reportid     = {RWTH-2023-10814},
      series       = {Schriften des Forschungszentrums Jülich. Reihe Energie
                      $\&$ Umwelt = Energy $\&$ environment},
      pages        = {1 Online-Ressource (202 Seiten) : Illustrationen,
                      Diagramme},
      year         = {2023},
      note         = {Druckausgabe: 2023. - Onlineausgabe: 2023. - Auch
                      veröffentlicht auf dem Publikationsserver der RWTH Aachen
                      University 2024; Dissertation, RWTH Aachen University, 2023},
      abstract     = {Thanks to the excellent passivation of hydrogenated
                      amorphous silicon (a-Si:H) to wafer surface, high open
                      circuit voltage (Voc) as well as power conversion efficiency
                      (η) have been achieved by the silicon heterojunction (SHJ)
                      solar cell technology in the recent decades. However, a
                      significant parasitic absorption in doped a-Si:H re- sults
                      in a low short circuit current density (Jsc), limiting the
                      cell performance of SHJ solar cells. Doped hydrogenated
                      nanocrystalline silicon oxide (nc-SiOx:H), consisting of
                      conductive silicon crystallites (nc-Si:H) embedded in
                      transparent hydrogenated amorphous silicon oxide (a-SiOx:H)
                      matrix, is an attractive alternative material to the
                      commonly used a-Si:H in SHJ solar cells to further improve
                      the cell performance. A trade-off between the optical and
                      the electrical properties always need to be taken into
                      account when applying the nc-SiOx:H(n) films in SHJ solar
                      cells. The goal of this thesis is to systematically
                      investigate the implementation of nc-SiOx:H(n) in SHJ solar
                      cells, to find the correlation between the material
                      properties and the de- vice performance, and to demonstrate
                      the industrial applicability of nc-SiOx:H in SHJ solar
                      cells.In the first part of this work, n-type nc-SiOx:H and
                      hydrogenated nanocrys- talline silicon (nc-Si:H) (x equals
                      zero) layers were developed and compared in an industrial
                      multi-substrate plasma enhanced chemical vapor deposition
                      (PECVD) system for the application in full-sized (>156×156
                      mm2) SHJ solar cells. By means of optical, electrical and
                      structural material characterizations, the influence of de-
                      position parameters, such as deposition power density (P ),
                      deposition pressure (p) and gas compositions, was
                      investigated. It was found that the response of nc-SiOx:H to
                      the variation of deposition parameters is different from
                      that of nc-Si:H layers. Moreover, a synergistic effect of
                      CO2 and PH3 or SiH4 on the material properties of nc-SiOx:H
                      films was observed. To acquire the nc-SiOx:H films with
                      high transparency and sufficient conductivity, high volume
                      fraction of a-SiOx:H (Fa-SiO2 ) and nc-Si:H (Fc), but low
                      a-Si:H volume fraction (Fa-Si:H) are required. Furthermore,
                      a very good homogeneity of the nc-SiOx:H(n) films prepared
                      in this large-area system was demonstrated.In the second
                      part of this work, the nc-SiOx:H layers at thickness of 15
                      nm were integrated in the rear-junction SHJ solar cells as
                      electron transport layer (ETL) on n-type quarter-M2-sized
                      c-Si wafers. It was demonstrated that the variation of
                      material properties of nc-SiOx:H(n) does not affect the Voc
                      but has a big influence on the Jsc and the fill factor (FF
                      ) of SHJ solar cells as well as the contact resistivity
                      (ρc) of indium tin oxide (ITO) / nc-SiOx:H(n). It was found
                      that the ρc of ITO / nc-SiOx:H(n) can be reduced by
                      increasing the dark conductivity (σ) and the Fc, or
                      reducing the optical band gap (E04) of nc-SiOx:H(n). In
                      total, the best performed cell in the preliminary
                      development shows Voc of 728 mV, FF of $76.7\%,$ Jsc of 39.1
                      mA/cm2 and η of $21.83\%.$ To have a comprehensive
                      knowledge on efficiency limit of the solar cell, a highly
                      predictive model was built in Quokk3 simulator and a power
                      loss analysis was carried out. It was found that the
                      bottleneck to the cell performance is the properties of the
                      front layer stacks. Then, a road map to $24\%$ of power
                      conversion efficiency was put forward.In the third part of
                      this work, a systematical optimization has been done to
                      improve the cell performance. The solar cells with
                      different ETL structure at various thickness were
                      fabricated. Significantly deteriorated contact property of
                      nc-SiOx:H(n) / ITO was observed when reducing the nc-SiOx:H
                      thickness from 20 to 5 nm, which can not be compensated by
                      the decreased parasitic absorption on the front. By
                      inserting the a-Si:H(n) or the highly conductive nc-Si:H(n)
                      between nc-SiOx:H(n) and ITO an enhancement of the contact
                      property can be achieved. Besides, it was demonstrated that
                      a rapid nucleation and a thinner incubation layer can be
                      obtained by depositing nc-Si:H(n) seed layer prior to the
                      nc-SiOx:H(n). Com- pared to the cells with nc-SiOx:H(n)
                      single layer, around $3\%$ relative gain of η is achieved
                      for the cells with nc-Si:H(n) / nc-SiOx:H(n) multi-layer. To
                      enhance the surface passivation, the hydrogen plasma treated
                      a-Si:H(i) layers were deposited as the passivating layer on
                      both side, yielding about $1\%abs$ increase of η.
                      Additionally, the devices with various transparent
                      conductive oxide (TCO) upon nc-SiOx:H(n) single layer were
                      prepared and their IV parameters were compared. It was found
                      that lower contact resistivity of nc-SiOx:H(n)/TCO and
                      nc-SiOx:H/Ag are reached for the cells with titanium doped
                      indium oxide (ITiO) compared to the devices with ITO.
                      Besides, we identified the optimal thickness of the
                      magnesium fluoride (MgF2) and ITO for the cells with 10 nm
                      nc-SiOx:H(n) single layer by OPAL 2 simulation to maximize
                      the generate current. More than 0.6 mA/cm2 gain of Jsc and
                      $0.3\%abs$ increase of η were observed without compromising
                      to FF and Voc, achieving 40.06 mA/cm2 of Jsc and $22.8\%$ of
                      η. Furthermore, the perimeter recombination in the devices
                      with four 1.9×1.9 cm2 cells embedded in a quarter-M2-sized
                      wafer was stud- ied by means of Quokka3 simulation. About 9
                      mV reduction of Voc was found for the small size cells
                      compared with the full-size cells. Then we applied the
                      optimized ETL, ITO, a-Si:H(i) and a-Si:H(p) in the
                      full-sized M2 wafers to totally omit the perimeter
                      recombination. To further improve the device performance,
                      ultra-thin (5nm) nc-Si:H(n) film was utilized and optimized
                      in the full-sized SHJ solar cells. A TCO sputter damage was
                      observed for the cells with porous nc-Si:H(n) and proved to
                      be related to the ion bombardment and the microstructure of
                      nc-Si:H(n). By using a denser nc-Si:H(n), a decreased
                      sputter damage and an enhancement of η from $22.4\%$ to
                      $23.6\%$ were demonstrated. The best solar cell exhibits Voc
                      of 741.8 mV, FF of $82.2\%,$ Jsc of 39.27 mA/cm2 and η of
                      $23.95\%$ on an M2-sized wafer (244.3 cm2).},
      cin          = {615610},
      ddc          = {621.3},
      cid          = {$I:(DE-82)615610_20140620$},
      pnm          = {Verbundvorhaben: Street - Einsatz von hocheffizienten
                      Solarzellen in elektrisch betriebenen Nutzfahrzeugen;
                      Teilvorhaben: Herstellung und Entwicklung von (0324275E) /
                      Touch - Technologie- und Charakterisierungsplattform für
                      die Entwicklung von hoch-effizienten
                      Silizium-Heterostruktursolarzellen (0324351)},
      pid          = {G:(BMWi)0324275E / G:(BMWi)0324351},
      typ          = {PUB:(DE-HGF)11 / PUB:(DE-HGF)3},
      urn          = {urn:nbn:de:hbz:5:2-1290542},
      doi          = {10.18154/RWTH-2023-10814},
      url          = {https://publications.rwth-aachen.de/record/973466},
}