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TY  - JOUR
AU  - Wiefels, Stefan
AU  - Kopperberg, Nils
AU  - Hofmann, Karl
AU  - Otterstedt, Jan
AU  - Wouters, Dirk J.
AU  - Waser, Rainer
AU  - Menzel, Stephan
TI  - Reliability Aspects of 28 nm BEOL‐Integrated Resistive Switching Random Access Memory
JO  - Physica status solidi / A
VL  - 221
IS  - 22
SN  - 1862-6319
CY  - Weinheim
PB  - Wiley-VCH
M1  - RWTH-2023-10855
SP  - 2300401
PY  - 2024
N1  - First published: 20 September 2023
LB  - PUB:(DE-HGF)16 ; PUB:(DE-HGF)7
UR  - <Go to ISI:>//WOS:001094269400001
DO  - DOI:10.1002/pssa.202300401
UR  - https://publications.rwth-aachen.de/record/973556
ER  -