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000973903 001__ 973903
000973903 005__ 20251010140405.0
000973903 0247_ $$2ISBN$$a978-4-86348-803-8
000973903 0247_ $$2ISBN$$a979-8-3503-1368-0
000973903 0247_ $$2ISBN$$a9798350313680
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000973903 0247_ $$2doi$$a10.23919/SISPAD57422.2023.10319606
000973903 037__ $$aRWTH-2023-11070
000973903 041__ $$aEnglish
000973903 1001_ $$0P:(DE-82)IDM03811$$aLinn, Tobias Sebastian$$b0$$urwth
000973903 1112_ $$aInternational Conference on Simulation of Semiconductor Processes and Devices$$cKobe$$d2023-09-27 - 2023-09-29$$gSISPAD 2023$$wJapan
000973903 245__ $$aStabilization of the Time-Dependent Drift-Diffusion Model for Fermi-Dirac Statistics$$honline, print
000973903 260__ $$a[Piscataway, NJ]$$bIEEE$$c2023
000973903 29510 $$a2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : SISPAD 2023 : September 27-29, 2023, Kobe Chamber of Commerce and Industry, Kobe, Japan / conference chair: S. Souma (Kobe Univ.) ; publication: Y. Kamakura (Osaka Inst. Technol.)
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000973903 591__ $$aGermany
000973903 7001_ $$0P:(DE-82)975174$$aFlasskamp, Jan$$b1$$urwth
000973903 7001_ $$0P:(DE-82)IDM00803$$aJungemann, Christoph$$b2$$urwth
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000973903 9141_ $$y2023
000973903 9151_ $$0StatID:(DE-HGF)0031$$2StatID$$aPeer reviewed article$$x0
000973903 9201_ $$0I:(DE-82)611410_20140620$$k611410$$lLehrstuhl und Institut für Theoretische Elektrotechnik$$x0
000973903 961__ $$c2023-11-28T08:35:49.057158$$x2023-11-28T08:35:49.057158$$z2023-11-28
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