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| 001 | 973903 | ||
| 005 | 20251010140405.0 | ||
| 024 | 7 | _ | |2 ISBN |a 978-4-86348-803-8 |
| 024 | 7 | _ | |2 ISBN |a 979-8-3503-1368-0 |
| 024 | 7 | _ | |2 ISBN |a 9798350313680 |
| 024 | 7 | _ | |2 SCOPUS |a SCOPUS:2-s2.0-85179135917 |
| 024 | 7 | _ | |2 WOS |a WOS:001117703800066 |
| 024 | 7 | _ | |2 doi |a 10.23919/SISPAD57422.2023.10319606 |
| 037 | _ | _ | |a RWTH-2023-11070 |
| 041 | _ | _ | |a English |
| 100 | 1 | _ | |0 P:(DE-82)IDM03811 |a Linn, Tobias Sebastian |b 0 |u rwth |
| 111 | 2 | _ | |a International Conference on Simulation of Semiconductor Processes and Devices |c Kobe |d 2023-09-27 - 2023-09-29 |g SISPAD 2023 |w Japan |
| 245 | _ | _ | |a Stabilization of the Time-Dependent Drift-Diffusion Model for Fermi-Dirac Statistics |h online, print |
| 260 | _ | _ | |a [Piscataway, NJ] |b IEEE |c 2023 |
| 295 | 1 | 0 | |a 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) : SISPAD 2023 : September 27-29, 2023, Kobe Chamber of Commerce and Industry, Kobe, Japan / conference chair: S. Souma (Kobe Univ.) ; publication: Y. Kamakura (Osaka Inst. Technol.) |
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| 591 | _ | _ | |a Germany |
| 700 | 1 | _ | |0 P:(DE-82)975174 |a Flasskamp, Jan |b 1 |u rwth |
| 700 | 1 | _ | |0 P:(DE-82)IDM00803 |a Jungemann, Christoph |b 2 |u rwth |
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| 914 | 1 | _ | |y 2023 |
| 915 | 1 | _ | |0 StatID:(DE-HGF)0031 |2 StatID |a Peer reviewed article |x 0 |
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