Lattice Deformation at Submicron Scale : X-Ray Nanobeam Measurements of Elastic Strain in Electron Shuttling Devices

Corley-Wiciak, C.; Langheinrich, W.; Anand, K.; Zaitsev, I.; Capellini, G.; Virgilio, M.; Zatterin, E.; Yamamoto, Y.; Reichmann, F.; Corley-Wiciak, Agnieszka Anna; Richter, C.; Zoellner, M. H.; Schreiber, Lars R.; Manganelli, C. L.

doi:10.18154/RWTH-2024-03271

TY  - JOUR
AU  - Corley-Wiciak, C.
AU  - Zoellner, M. H.
AU  - Zaitsev, I.
AU  - Anand, K.
AU  - Zatterin, E.
AU  - Yamamoto, Y.
AU  - Corley-Wiciak, Agnieszka Anna
AU  - Reichmann, F.
AU  - Langheinrich, W.
AU  - Schreiber, Lars R.
AU  - Manganelli, C. L.
AU  - Virgilio, M.
AU  - Richter, C.
AU  - Capellini, G.
TI  - Lattice Deformation at Submicron Scale : X-Ray Nanobeam Measurements of Elastic Strain in Electron Shuttling Devices
JO  - Physical review applied
VL  - 20
IS  - 2
SN  - 2331-7019
CY  - College Park, Md. [u.a.]
PB  - American Physical Society
M1  - RWTH-2024-03271
SP  - 024056
PY  - 2023
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001256508500001
DO  - DOI:10.1103/PhysRevApplied.20.024056
UR  - https://publications.rwth-aachen.de/record/983205
ER  -

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