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000984466 1001_ $$00009-0006-7823-9048$$aCriswell, Scott G.$$b0
000984466 245__ $$aNanoscale Infrared Spectroscopic Characterization of Extended Defects in 4H-Silicon Carbide$$honline, print
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000984466 7001_ $$aMahadik, Nadeemullah A.$$b1
000984466 7001_ $$aGallagher, James C.$$b2
000984466 7001_ $$0P:(DE-82)IDM04463$$aBarnett, Julian$$b3$$urwth
000984466 7001_ $$aKim, Luke$$b4
000984466 7001_ $$aGhorbani, Morvarid$$b5
000984466 7001_ $$00000-0002-5314-5225$$aKamaliya, Bhaveshkumar$$b6
000984466 7001_ $$00000-0002-9161-5769$$aBassim, Nabil D.$$b7
000984466 7001_ $$0P:(DE-82)IDM00127$$aTaubner, Thomas$$b8$$urwth
000984466 7001_ $$00000-0003-0374-2168$$aCaldwell, Joshua D.$$b9$$eCorresponding author
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