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@PHDTHESIS{Sommer:988396,
author = {Sommer, Nils},
othercontributors = {Waser, Rainer and Jungemann, Christoph},
title = {{M}odeling and simulation of bilayer area-dependent valence
change memory devices},
school = {Rheinisch-Westfälische Technische Hochschule Aachen},
type = {Dissertation},
address = {Aachen},
publisher = {RWTH Aachen University},
reportid = {RWTH-2024-06154},
pages = {1 Online-Ressource : Illustrationen},
year = {2024},
note = {Veröffentlicht auf dem Publikationsserver der RWTH Aachen
University; Dissertation, Rheinisch-Westfälische Technische
Hochschule Aachen, 2024},
abstract = {The development of future semiconductor devices brings
major challenges. Moore's famous law has predicted the
miniaturization for decades. However, current technologies
are reaching their physical limits. Further, the increasing
number of computer technologies worldwide requires more and
more electrical energy. Therefore, new concepts are
proposed, e.g., Redox-based Random Access Memory (ReRAM),
in-memory computing or neuromorphic applications. In this
context, valence change memory cells (VCM) are promising
candidates for the implementations of these concepts.
Area-dependent switching VCM cells are a special type of VCM
cells. Many of the area-dependent VCM cells consist of a
bilayer structure, i.e., there are two semiconducting
metal-oxide layers in between two metal electrodes. The
resistance of an area-dependent device scales linearly with
the device area. In addition, the resistance of the VCM cell
can be manipulated by applying a voltage stimuli to the
electrodes. It was shown experimentally that there is an
exchange of oxygen ions between the two metal-oxide layers
when the resistance of the device is changed. Hence, it was
suggested that this exchange is the fundamental reason for
the resistance change. However, this idea has been barley
tested by physically models so far. In this work, two
physically motivated models for area-dependent bilayer VCM
cells are developed. Both models incorporate the idea of an
oxygen exchange between the two metal-oxide layers. By means
of these models, the influence of an oxygen exchange on the
device resistance is investigated. Under special interest is
the influence of different materials parameters on the
resistance change as well as on the dynamically movement of
the oxygen ions. It is shown that device resistance can be
changed by the oxygen exchange. Thereby, the behavior of the
resistance change depends on how far the oxygen ions migrate
into the bulk of the materials. Further, a dependency on the
material permittivities is shown. Another property of
area-dependent VCM cells is that the resistance changes
gradually under applied voltages. By means of the developed
models it is investigated what is necessary to gain a
gradual change of the resistance. Furthermore, the models
are used for a detailed analysis of the movement of the
oxygen ions and how the charge carriers, i.e., electrons and
holes, overcome a tunnel barrier that is created by one of
the oxide layers. At the end of this work, the simulation
results are compared to experimental measurements from the
literature to identify which measured effects can be
explained by the models. In addition, it is discussed which
effects cannot be explained by the model of a simple oxygen
exchange and which extension on the models are necessary.},
cin = {611610},
ddc = {621.3},
cid = {$I:(DE-82)611610_20140620$},
pnm = {BMBF 16ME0398K - Verbundprojekt: Neuro-inspirierte
Technologien der künstlichen Intelligenz für die
Elektronik der Zukunft - NEUROTEC II - (BMBF-16ME0398K) /
BMBF 16ES1133K - Verbundprojekt: Neuro-inspirierte
Technologien der künstlichen Intelligenz für die
Elektronik der Zukunft - NEUROTEC -, Teilvorhaben:
Forschungszentrum Jülich (16ES1133K)},
pid = {G:(DE-82)BMBF-16ME0398K / G:(BMBF)16ES1133K},
typ = {PUB:(DE-HGF)11},
doi = {10.18154/RWTH-2024-06154},
url = {https://publications.rwth-aachen.de/record/988396},
}