h1

000995366 001__ 995366
000995366 005__ 20251006114738.0
000995366 0247_ $$2ISSN$$a0018-9383
000995366 0247_ $$2ISSN$$a1557-9646
000995366 0247_ $$2SCOPUS$$aSCOPUS:2-s2.0-85205908989
000995366 0247_ $$2WOS$$aWOS:001328977900001
000995366 0247_ $$2datacite_doi$$a10.18154/RWTH-2024-09841
000995366 0247_ $$2doi$$a10.1109/TED.2024.3461676
000995366 037__ $$aRWTH-2024-09841
000995366 041__ $$aEnglish
000995366 082__ $$a620
000995366 1001_ $$aMunir, Faisal$$b0$$eCorresponding author
000995366 245__ $$aEvaluation Methods for ReRAM Potentiation on Sub-Nanosecond Timescales$$honline, print
000995366 260__ $$aNew York, NY$$bIEEE$$c2024
000995366 3367_ $$00$$2EndNote$$aJournal Article
000995366 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal
000995366 3367_ $$2BibTeX$$aARTICLE
000995366 3367_ $$2DRIVER$$aarticle
000995366 3367_ $$2DataCite$$aOutput Types/Journal article
000995366 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000995366 500__ $$aEarly Access Article
000995366 588__ $$aDataset connected to , , , CrossRef, Journals: publications.rwth-aachen.de
000995366 591__ $$aGermany
000995366 7001_ $$aSchön, Daniel$$b1
000995366 7001_ $$aMenzel, Stephan$$b2
000995366 7001_ $$0P:(DE-82)IDM06535$$aStasner, Pascal$$b3$$urwth
000995366 7001_ $$0P:(DE-82)IDM01464$$aWaser, Rainer$$b4$$urwth
000995366 7001_ $$aWiefels, Stefan$$b5
000995366 773__ $$0PERI:(DE-600)2028088-9$$a10.1109/TED.2024.3461676$$n11$$p6691-6697$$tIEEE transactions on electron devices : ED$$v71$$x1557-9646$$y2024
000995366 8564_ $$uhttps://publications.rwth-aachen.de/record/995366/files/995366.pdf$$yOpenAccess
000995366 909CO $$ooai:publications.rwth-aachen.de:995366$$popenaire$$popen_access$$pdriver$$pdnbdelivery$$pVDB
000995366 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)IDM06535$$aRWTH Aachen$$b3$$kRWTH
000995366 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)IDM01464$$aRWTH Aachen$$b4$$kRWTH
000995366 9141_ $$y2024
000995366 9151_ $$0StatID:(DE-HGF)0031$$2StatID$$aPeer reviewed article$$x0
000995366 915__ $$0LIC:(DE-HGF)CCBY4$$2HGFVOC$$aCreative Commons Attribution CC BY 4.0
000995366 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bASC$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bIEEE T ELECTRON DEV : 2022$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)0113$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)0160$$2StatID$$aDBCoverage$$bEssential Science Indicators$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000995366 915__ $$0StatID:(DE-HGF)0600$$2StatID$$aDBCoverage$$bEbsco Academic Search$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)1230$$2StatID$$aDBCoverage$$bCurrent Contents - Electronics and Telecommunications Collection$$d2023-10-24
000995366 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5$$d2023-10-24
000995366 9201_ $$0I:(DE-82)611610_20140620$$k611610$$lLehrstuhl für Werkstoffe der Elektrotechnik II und Institut für Werkstoffe der Elektrotechnik$$x0
000995366 961__ $$c2024-10-21T09:11:34.041036$$x2024-10-21T09:11:34.041036$$z2024-10-21T09:11:34.041036
000995366 9801_ $$aFullTexts
000995366 980__ $$aI:(DE-82)611610_20140620
000995366 980__ $$aUNRESTRICTED
000995366 980__ $$aVDB
000995366 980__ $$ajournal