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@INPROCEEDINGS{Kopperberg:996496,
      author       = {Kopperberg, Nils and Wiefels, Stefan and Hofmann, Karl and
                      Otterstedt, Jan and Wouters, Dirk J. and Waser, Rainer and
                      Menzel, Stephan},
      title        = {{P}hysics-based {M}odeling and {E}xperimental
                      {C}haracterization of {E}ndurance in {F}ilamentary {VCM}
                      {R}e{RAM}},
      reportid     = {RWTH-2024-10642},
      year         = {2023},
      month         = {Aug},
      date          = {2023-08-29},
      organization  = {2. Jülich Aachen Neuromorphic
                       Computing Day, Jülich (Germany), 29
                       Aug 2023 - 30 Aug 2023},
      cin          = {611610 / 080009},
      cid          = {$I:(DE-82)611610_20140620$ / $I:(DE-82)080009_20140620$},
      pnm          = {SFB 917 T01 - Fehlermechanismus und Zuverlässigkeit von
                      Valenzwechselspeichern (T01*) (426866072) / DFG project
                      167917811 - SFB 917: Resistiv schaltende Chalkogenide für
                      zukünftige Elektronikanwendungen: Struktur, Kinetik und
                      Bauelementskalierung "Nanoswitches" (167917811)},
      pid          = {G:(GEPRIS)426866072 / G:(GEPRIS)167917811},
      typ          = {PUB:(DE-HGF)24},
      url          = {https://publications.rwth-aachen.de/record/996496},
}