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@ARTICLE{Illarionov:997041,
author = {Illarionov, Yu Yu and Knobloch, T. and Uzlu, B. and
Banshchikov, A. G. and Ivanov, I. A. and Sverdlov, V. and
Otto, M. and Stoll, S. L. and Vexler, M. I. and Waltl, M.
and Wang, Z. and Manna, B. and Neumaier, D. and Lemme, Max
C. and Sokolov, N. S. and Grasser, T.},
title = {{V}ariability and high temperature reliability of graphene
field-effect transistors with thin epitaxial {C}a{F}2
insulators},
journal = {npj 2D materials and applications},
volume = {8},
issn = {2397-7132},
address = {London},
publisher = {Nature Publishing Group},
reportid = {RWTH-2024-11007},
pages = {23},
year = {2024},
cin = {618710},
ddc = {670},
cid = {$I:(DE-82)618710_20170609$},
pnm = {GIMMIK : Graphenprozessierung auf 200mm Wafern für
mikroelektronische Anwendungen (BMBF-03XP0210F) / DFG
project G:(GEPRIS)412113712 - Ultimatives Skalierungs- und
Leistungspotential von MoS2 Feldeffekttransistoren (
ULTIMOS2) (412113712) / 2D-EPL - Graphene Flagship 2D
Experimental Pilot Line (952792) / GrapheneCore3 - Graphene
Flagship Core Project 3 (881603) / WiPLASH - Architecting
More Than Moore – Wireless Plasticity for Heterogeneous
Massive Computer Architectures (863337)},
pid = {G:(DE-82)BMBF-03XP0210F / G:(GEPRIS)412113712 /
G:(EU-Grant)952792 / G:(EU-Grant)881603 /
G:(EU-Grant)863337},
typ = {PUB:(DE-HGF)16},
UT = {WOS:001187766400001},
doi = {10.1038/s41699-024-00461-0},
url = {https://publications.rwth-aachen.de/record/997041},
}
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