TY - JOUR AU - Weirich, Thomas E. TI - RAPID : an ImageJ macro for indexing electron diffraction zone axis spot patterns of cubic materials JO - Journal of applied crystallography VL - 57 IS - 6 SN - 1600-5767 CY - [Erscheinungsort nicht ermittelbar] PB - Wiley-Blackwell M1 - RWTH-2024-11150 SP - 2017-2029 PY - 2024 LB - PUB:(DE-HGF)16 UR - <Go to ISI:>//WOS:001387959000029 DO - DOI:10.1107/S1600576724010215 UR - https://publications.rwth-aachen.de/record/997238 ER -