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TY  - JOUR
AU  - Weirich, Thomas E.
TI  - RAPID : an ImageJ macro for indexing electron diffraction zone axis spot patterns of cubic materials
JO  - Journal of applied crystallography
VL  - 57
IS  - 6
SN  - 1600-5767
CY  - [Erscheinungsort nicht ermittelbar]
PB  - Wiley-Blackwell
M1  - RWTH-2024-11150
SP  - 2017-2029
PY  - 2024
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:001387959000029
DO  - DOI:10.1107/S1600576724010215
UR  - https://publications.rwth-aachen.de/record/997238
ER  -