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000998954 001__ 998954 000998954 005__ 20250416122713.0 000998954 0247_ $$2ISBN$$a979-8-3503-6555-9 000998954 0247_ $$2ISBN$$a979-8-3503-6556-6 000998954 0247_ $$2ISBN$$a9798350365559 000998954 0247_ $$2ISBN$$a9798350365566 000998954 0247_ $$2ISSN$$a2373-0862 000998954 0247_ $$2SCOPUS$$aSCOPUS:2-s2.0-85195392489 000998954 0247_ $$2doi$$a10.1109/LATS62223.2024.10534600 000998954 037__ $$aRWTH-2024-11768 000998954 041__ $$aEnglish 000998954 1001_ $$0P:(DE-82)IDM04616$$aSantos Copetti, Thiago$$b0$$eCorresponding author$$urwth 000998954 1112_ $$aIEEE 25. Latin American Test Symposium$$cMaceio$$d2024-04-09 - 2024-04-12$$gLATS$$wBrazil 000998954 245__ $$aAnalyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs$$honline, print 000998954 260__ $$a[Piscataway, NJ]$$bIEEE$$c2024 000998954 29510 $$a2024 IEEE 25th Latin American Test Symposium (LATS) : 9-12 April 2024 / publisher: IEEE ; [general co-chairs: Leticia Bolzani Poehls – RWTH Aachen, Germany; Yervant Zorian – Synopsys, USA ; publication co-chairs: Jarbas Silveira – UFC, Brazil; Thiago S. Copetti – RWTH Aachen, Germany] 000998954 300__ $$a6 Seiten 000998954 3367_ $$033$$2EndNote$$aConference Paper 000998954 3367_ $$0PUB:(DE-HGF)7$$2PUB:(DE-HGF)$$aContribution to a book$$mcontb 000998954 3367_ $$0PUB:(DE-HGF)8$$2PUB:(DE-HGF)$$aContribution to a conference proceedings$$bcontrib$$mcontrib 000998954 3367_ $$2BibTeX$$aINPROCEEDINGS 000998954 3367_ $$2DRIVER$$aconferenceObject 000998954 3367_ $$2DataCite$$aOutput Types/Conference Paper 000998954 3367_ $$2ORCID$$aCONFERENCE_PAPER 000998954 536__ $$0G:(DE-82)BMBF-16ES1134$$aBMBF 16ES1134 - Verbundprojekt: Neuro-inspirierte Technologien der künstlichen Intelligenz für die Elektronik der Zukunft - NEUROTEC - (BMBF-16ES1134)$$cBMBF-16ES1134$$x0 000998954 536__ $$0G:(DE-82)EXS-SF-StUpPD_425-22$$aStUpPD_425-22 - Study of Memristive Devices' Reliability considering PV and Operating Conditions (EXS-SF-StUpPD_425-22)$$cEXS-SF-StUpPD_425-22$$x1 000998954 536__ $$0G:(DE-82)BMBF-16ES1133K$$aG:(DE-82)BMBF-16ES1133K - NEUROTEC II (BMBF-16ES1133K)$$cBMBF-16ES1133K$$x2 000998954 536__ $$0G:(DE-82)EXS-SU$$aERS Start-Up (EXS) - Start-Up for Juniorprofessor and Postdocs (EXS-SU)$$cEXS-SU$$x3 000998954 536__ $$0G:(DE-82)EXS$$aEXS - Excellence Strategy (EXS)$$cEXS$$x4 000998954 588__ $$aDataset connected to CrossRef Conference 000998954 591__ $$aGermany 000998954 591__ $$aNetherlands 000998954 7001_ $$0P:(DE-82)1002278$$aChordia, Aksh$$b1$$urwth 000998954 7001_ $$aFieback, M.$$b2 000998954 7001_ $$aTaouil, M.$$b3 000998954 7001_ $$aHamdioui, S.$$b4 000998954 7001_ $$0P:(DE-82)820257$$aBolzani Pöhls, Letícia$$b5$$eCorresponding author$$urwth 000998954 909CO $$ooai:publications.rwth-aachen.de:998954$$pVDB 000998954 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)IDM04616$$aRWTH Aachen$$b0$$kRWTH 000998954 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)1002278$$aRWTH Aachen$$b1$$kRWTH 000998954 9101_ $$0I:(DE-588b)36225-6$$6P:(DE-82)820257$$aRWTH Aachen$$b5$$kRWTH 000998954 9141_ $$y2024 000998954 9151_ $$0StatID:(DE-HGF)0031$$2StatID$$aPeer reviewed article$$x0 000998954 9201_ $$0I:(DE-82)611110_20170101$$k611110$$lLehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf$$x0 000998954 961__ $$c2024-12-10T11:38:23.306310$$x2024-12-10T11:38:23.306310$$z2024-12-10 000998954 980__ $$aI:(DE-82)611110_20170101 000998954 980__ $$aMASSMEDIA 000998954 980__ $$aUNRESTRICTED 000998954 980__ $$aVDB 000998954 980__ $$acontb 000998954 980__ $$acontrib