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| 024 | 7 | _ | |2 ISBN |a 9798350365559 |
| 024 | 7 | _ | |2 ISBN |a 9798350365566 |
| 024 | 7 | _ | |2 ISSN |a 2373-0862 |
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| 024 | 7 | _ | |2 doi |a 10.1109/LATS62223.2024.10534600 |
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| 100 | 1 | _ | |0 P:(DE-82)IDM04616 |a Santos Copetti, Thiago |b 0 |e Corresponding author |u rwth |
| 111 | 2 | _ | |a IEEE 25. Latin American Test Symposium |c Maceio |d 2024-04-09 - 2024-04-12 |g LATS |w Brazil |
| 245 | _ | _ | |a Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs |h online, print |
| 260 | _ | _ | |a [Piscataway, NJ] |b IEEE |c 2024 |
| 295 | 1 | 0 | |a 2024 IEEE 25th Latin American Test Symposium (LATS) : 9-12 April 2024 / publisher: IEEE ; [general co-chairs: Leticia Bolzani Poehls – RWTH Aachen, Germany; Yervant Zorian – Synopsys, USA ; publication co-chairs: Jarbas Silveira – UFC, Brazil; Thiago S. Copetti – RWTH Aachen, Germany] |
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| 536 | _ | _ | |0 G:(DE-82)EXS-SF-StUpPD_425-22 |a StUpPD_425-22 - Study of Memristive Devices' Reliability considering PV and Operating Conditions (EXS-SF-StUpPD_425-22) |c EXS-SF-StUpPD_425-22 |x 1 |
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| 700 | 1 | _ | |a Taouil, M. |b 3 |
| 700 | 1 | _ | |a Hamdioui, S. |b 4 |
| 700 | 1 | _ | |0 P:(DE-82)820257 |a Bolzani Pöhls, Letícia |b 5 |e Corresponding author |u rwth |
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