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Dynamic Compensation of Threshold-Voltage Shift in SiGe SB-FET for Operation in Ultra-wide Temperature Range
Beyer, C. ; Mikolajick, T. ; Knoch, J. ; Trommer, J.
Device Research Conference 2025 : workshop proceedings : date of conference: 22-25 June 2025; conference location: Durham, NC, USA / DRC, 83rd Device Research Conference, June 22-25, 2025, Duke University, Durham, North Carolina; sponsors and organizers: IEEE, Electron Devices Society, Nextron - Micro Probe System, NSF ; general chair: Saptarshi Das (Penn State University, USA)
DOI: 10.1109/DRC66027.2025.11215163
Contribution to a book/Contribution to a conference proceedings
2025
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