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Quantitative Testing

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In
Embedded Systems Week 2008 : CODES + ISSS'08, CASES'08, EMSOFT'08 ; October 19 - 24, 2008, Atlanta, Georgia, USA / sponsored by IEEE Council on Electronic Design Automation ..., Seiten/Artikel-Nr: 227-236

Konferenz/Event:Embedded Systems Week 2008 , Atlanta , USA , 2008-10-19 - 2008-10-24

ImpressumNew York, NY : ACM

Umfang227-236

ISBN978-1-60558-468-3

1 CD-ROM. - Nebent.: ESWEEK 2008 compilation proceedings

Einrichtungen

  1. Lehrstuhl für Informatik 2 (Softwaremodellierung und Verifikation) (121310)
  2. Fachgruppe Informatik (120000)



Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
data medium

Sprache
English

Anmerkung
Peer reviewed article

Interne Identnummern
RWTH-CONV-173345
Datensatz-ID: 100534

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Document types > Events > Contributions to a conference proceedings
Document types > Books > Contributions to a book
Faculty of Computer Science (Fac.9)
Public records
Publications database
120000
121310
 Record created 2013-01-28, last modified 2026-04-17
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