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@TECHREPORT{Weirich:1010739,
      author       = {Weirich, Thomas E.},
      title        = {{U}nit{C}ell{SAED} − {A}n {I}mage{J}-{B}ased {T}ool for
                      {D}etermining {U}nit {C}ell {P}arameters from {S}elected
                      {A}rea {E}lectron {D}iffraction {P}atterns},
      address      = {Aachen},
      publisher    = {Universitätsbibliothek der RWTH Aachen},
      reportid     = {RWTH-2025-04291},
      pages        = {20 Seiten : Illustrationen, Tabellen, Diagramme},
      year         = {2025},
      subtyp        = {White Paper},
      cin          = {025000},
      cid          = {$I:(DE-82)025000_20140620$},
      pnm          = {DFG project G:(GEPRIS)550762912 - Skalenübergreifende
                      elektronenmikroskopische Charakterisierung von
                      Verfestigungs- und Schädigungsmechanismen (Project B04)
                      (550762912) / DFG project G:(GEPRIS)278868966 - TRR 188:
                      Schädigungskontrollierte Umformprozesse (278868966)},
      pid          = {G:(GEPRIS)550762912 / G:(GEPRIS)278868966},
      typ          = {PUB:(DE-HGF)29},
      urn          = {urn:nbn:de:101:1-2505040133435.704620245024},
      doi          = {10.18154/RWTH-2025-04291},
      url          = {https://publications.rwth-aachen.de/record/1010739},
}