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@TECHREPORT{Weirich:1010739,
author = {Weirich, Thomas E.},
title = {{U}nit{C}ell{SAED} − {A}n {I}mage{J}-{B}ased {T}ool for
{D}etermining {U}nit {C}ell {P}arameters from {S}elected
{A}rea {E}lectron {D}iffraction {P}atterns},
address = {Aachen},
publisher = {Universitätsbibliothek der RWTH Aachen},
reportid = {RWTH-2025-04291},
pages = {20 Seiten : Illustrationen, Tabellen, Diagramme},
year = {2025},
subtyp = {White Paper},
cin = {025000},
cid = {$I:(DE-82)025000_20140620$},
pnm = {DFG project G:(GEPRIS)550762912 - Skalenübergreifende
elektronenmikroskopische Charakterisierung von
Verfestigungs- und Schädigungsmechanismen (Project B04)
(550762912) / DFG project G:(GEPRIS)278868966 - TRR 188:
Schädigungskontrollierte Umformprozesse (278868966)},
pid = {G:(GEPRIS)550762912 / G:(GEPRIS)278868966},
typ = {PUB:(DE-HGF)29},
urn = {urn:nbn:de:101:1-2505040133435.704620245024},
doi = {10.18154/RWTH-2025-04291},
url = {https://publications.rwth-aachen.de/record/1010739},
}