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Lifecycle Management of RRAMs: Quality and Reliability



In
2024 IEEE International Conference on Design, Test and Technology of Integrated Systems (DTTIS) : October 14-16, 2024, Aix-en-Provence, France / DTTIS 2024, IEEE, AMU - Aix Marseille Universiré [und weitere], Seiten/Artikel-Nr: 4 Seiten

Konferenz/Event:2024 IEEE International Conference on Design, Test and Technology of Integrated Systems , Aix-EN-PROVENCE , France , DTTIS 2024 , 2024-10-14 - 2024-10-16

Impressum[Piscataway, NJ] : IEEE

Umfang4 Seiten

ISBN979-8-3503-6312-8, 979-8-3503-6313-5, 9798350363128, 9798350363135

Online
DOI: 10.1109/DTTIS62212.2024.10780289


Einrichtungen

  1. Lehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf (611110)



Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
online, print

Sprache
English

Anmerkung
Peer review status of article unknown

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85215013183
WOS Core Collection: WOS:001468545500026
OpenAlex: W4405363117

Interne Identnummern
RWTH-2025-06136
Datensatz-ID: 1014540

Beteiligte Länder
Germany

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The record appears in these collections:
Document types > Events > Contributions to a conference proceedings
Document types > Books > Contributions to a book
Faculty of Electrical Engineering and Information Technology (Fac.6)
Public records
Publications database
611110
 Record created 2025-07-14, last modified 2026-09-14
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