h1

h2

h3

h4

h5
h6
http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png

CMOS Transistors under Uniaxial Stress on Ultra-Thin Chips for Applications in Bendable Image Sensors

; ; ; ;

In
PRIME 2012 : 8th Conference on Ph.D. Research in Microelectronics & Electronics, 12 - 15 Juni 2012, Aachen, Germany / [General Chairs: Stefan Heinen ...], Seiten/Artikel-Nr: 271-274

Konferenz/Event:8. Conference on Ph.D. Research in Microelectronics & Electronics , Aachen , Germany , PRIME 2012 , 12-06-2012 - 15-06-2012

ImpressumBerlin [u.a.] : VDE-Verl.

Umfang271-274

ISBN978-3-8007-3442-9

Datenträger: 1 CD-ROM

Online
URL: http://www.vde-verlag.de/proceedings-de/453442069.html

Einrichtungen

  1. Lehrstuhl für Werkstoffe der Elektrotechnik I und Institut für Werkstoffe der Elektrotechnik (611510)


Inhaltliche Beschreibung (Schlagwörter)
flexible ultra-thin silicon chips (frei) ; uniaxial stress (frei) ; bending machine (frei) ; piezoresistance (frei) ; chip-in-foil (frei)

External link:
Download fulltext
Fulltext

Dokumenttyp
Contribution to a conference proceedings/Contribution to a book

Format
data medium, online

Sprache
English

Anmerkung
Peer reviewed article

Interne Identnummern
RWTH-CONV-199986
Datensatz-ID: 197793

Beteiligte Länder
Germany

 GO

QR Code for this record

The record appears in these collections:
Document types > Events > Contributions to a conference proceedings
Document types > Books > Contributions to a book
Faculty of Electrical Engineering and Information Technology (Fac.6)
Public records
Publications database
611510
 Record created 2013-02-04, last modified 2022-11-02
Similar records


External link:
Download fulltext
Fulltext
Rate this document:

Rate this document:
1
2
3
4
5
 
(Not yet reviewed)