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Re-addressing SRAM design and measurement for sub-threshold operation in view of classic 6T vs. standard cell based implementations

Fan, Xin ; Stuijt, Jan ; Wang, Rui ; Liu, Bo ; Gemmeke, Tobias^RWTH*

In
Proceedings of the Eighteenth International Symposium on Quality Electronic Design : ISQED 2017 : March 14-15, 2017, Santa Clara, California USA / ISQED 2017 is held with technical sponsorship from the IEEE Electron Devices Society (EDS), IEEE Reliability Society, and in cooperation with the IEEE Circuits and Systems Society (CAS) and the ACM Special Interest Group on Design Automation (ACM/sigDA), Seiten/Artikel-Nr: 6 Seiten

2017

Konferenz/Event:18. International Symposium on Quality Electronic Design , Santa Clara, CA , USA , ISQED , 2017-03-14 - 2017-03-15

ImpressumPiscataway, NJ : IEEE

Umfang6 Seiten

ISBN978-1-5090-5403-9, 978-1-5090-5404-6, 978-1-5090-5405-3

Datenträger: USB-Stick

Online
DOI: 10.1109/ISQED.2017.7918294
10.1109/ISQED.2017.7918294

Einrichtungen

1. Lehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf (611110)

Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
online, print, data medium

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
INSPEC: 16854696
SCOPUS: SCOPUS:2-s2.0-85019590102
WOS Core Collection: WOS:000403335900012

Interne Identnummern
RWTH-2018-221453
Datensatz-ID: 717981

Beteiligte Länder
Germany, Netherlands