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Hard-to-Detect Fault Analysis in FinFET SRAMs

; ; ; ; ;

In
IEEE transactions on very large scale integration (VLSI) systems 29(6), Seiten/Artikel-Nr.:1271-1284

ImpressumNew York, NY : Institute of Electrical and Electronics Engineers

ISSN1557-9999

Online
DOI: 10.1109/TVLSI.2021.3071940


Einrichtungen

  1. Lehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf (611110)


Thematische Einordnung (Klassifikation)
DDC: 620


Dokumenttyp
Journal Article

Format
online, print

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85104660216
WOS Core Collection: WOS:000658341800020
OpenAlex: W3153338730

Interne Identnummern
RWTH-2021-06103
Datensatz-ID: 821224

Beteiligte Länder
Brazil, Germany, Netherlands

Lizenzstatus der Zeitschrift

 GO

Medline ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
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The record appears in these collections:
Document types > Articles > Journal Articles
Faculty of Electrical Engineering and Information Technology (Fac.6)
Public records
Publications database
611110
 Record created 2021-06-28, last modified 2026-09-10
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