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Improving the Detection of Undefined State Faults in FinFET SRAMs

; ; ; ; ; ;

In
2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 28-30 June 2021, Seiten/Artikel-Nr: 6 Seiten

Konferenz/Event:16. International Conference on Design & Technology of Integrated Systems in Nanoscale Era , Montpellier , France , DTIS 2021 , 2021-06-28 - 2021-06-30

Umfang6 Seiten

ISBN978-1-6654-3653-3, 978-1-6654-3654-0, 978-1-6654-3655-7

Datenträger: USB-Stick. - Zweitveröffentlicht auf dem Publikationsserver der RWTH Aachen University 2023

Online
DOI: 10.1109/DTIS53253.2021.9505130

DOI: 10.18154/RWTH-2021-11078
URL: https://publications.rwth-aachen.de/record/836110/files/836110_ZV.pdf

Einrichtungen

  1. Lehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf (611110)


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Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
online, print, data medium

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
WOS Core Collection: WOS:000717280900018
SCOPUS: SCOPUS:2-s2.0-85125641497

Interne Identnummern
RWTH-2021-11078
Datensatz-ID: 836110

Beteiligte Länder
Brazil, Germany, Netherlands

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The record appears in these collections:
Document types > Events > Contributions to a conference proceedings
Document types > Books > Contributions to a book
Faculty of Electrical Engineering and Information Technology (Fac.6)
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611110
 Record created 2021-11-29, last modified 2025-11-10
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