Evaluating the Impact of Process Variation on RRAMs

Brum, E. (Corresponding author) ; Fieback, M. ; Santos Copetti, Thiago (Corresponding author)^RWTH* ; Jiayi, H.^RWTH* ; Hamdioui, S. ; Vargas, F. (Corresponding author) ; Poehls, L. M. Bolzani (Corresponding author)

In
[2021 IEEE 22nd Latin American Test Symposium, LATS, 2021-10-27 - 2021-10-29, Punta del Este, Uruguay]

2021 & 2023

Konferenz/Event:IEEE 22. Latin American Test Symposium , Punta del Este , Uruguay , LATS , 2021-10-27 - 2021-10-29

ISBN978-1-6654-2057-0, 978-1-6654-2058-7

Zweitveröffentlicht auf dem Publikationsserver der RWTH Aachen University 2023

Online
DOI: 10.18154/RWTH-2022-05410
DOI: 10.1109/LATS53581.2021.9651789
10.1109/LATS53581.2021.9651789
URL: https://publications.rwth-aachen.de/record/847518/files/847518_ZV.pdf

Einrichtungen

Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
online, print

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85124335477
WOS Core Collection: WOS:000923746100009

Interne Identnummern
RWTH-2022-05410
Datensatz-ID: 847518

Beteiligte Länder
Brazil, Germany, Netherlands

Record created 2022-05-30, last modified 2025-10-14

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