Gast ::
Validating a DFT Strategy’s Detection Capability regarding Emerging Faults in RRAMs
; ;
In
Proceedings of the 2021 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) : VLSI : virtual conference - 4-8 October 2021, Singapore, Nanyang Technological University Center / conference general co-chairs: Anupam Chattopadhyay (Nanyang Technological University, Singapore) and Andrea Calimera (Politecnico di Torino, Italy); publisher: IEEE
2021
Online
DOI: 10.1109/VLSI-SoC53125.2021.9606993
Einrichtungen
Dokumenttyp
Contribution to a book/Contribution to a conference proceedings
Format
online, print
Sprache
English
Anmerkung
Peer reviewed article
Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85122923779
WOS Core Collection: WOS:000814059800016
Interne Identnummern
RWTH-2022-05412
Datensatz-ID: 847520
Beteiligte Länder
Germany
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