Probing the onset of wurtzite phase formation in (V,Al)N thin films by transmission electron microscopy and atom probe tomography

Mehr Informationen
Referenzen
Diskussion
Dateien

Probing the onset of wurtzite phase formation in (V,Al)N thin films by transmission electron microscopy and atom probe tomography - RWTH-2022-06232

Main document Datei(en):

Ähnliche Datensätze

h1

h2

h3

h4

h5

h6

RWTH

Kontakt

RWTH Publications

Allgemeines