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Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs

; ; ; ; ;

In
23rd IEEE Latin-American Test Symposium : Montevideo, Uruguay, 5th-8th September 2022 / LATS 2022 ; technical sponsors: the Institute of Electrical and Electronics Engineering Inc, Test Technology Technical Council, Seiten/Artikel-Nr: 6 Seiten

Konferenz/Event:23. Latin American Test Symposium , Montevideo , Uruguay , LATS 2022 , 2022-09-05 - 2022-09-08

Impressum[Piscataway, NJ] : IEEE

Umfang6 Seiten

ISBN978-1-6654-5707-1, 978-1-6654-5708-8, 978-1-66545-707-1, 978-1-66545-708-8

Online
DOI: 10.1109/LATS57337.2022.9936991


Einrichtungen

  1. Lehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf (611110)



Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
online, print

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85142828981
WOS Core Collection: WOS:000903702200017

Interne Identnummern
RWTH-2023-01211
Datensatz-ID: 918250

Beteiligte Länder
Germany, Netherlands

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The record appears in these collections:
Document types > Events > Contributions to a conference proceedings
Document types > Books > Contributions to a book
Faculty of Electrical Engineering and Information Technology (Fac.6)
Public records
Publications database
611110
 Record created 2023-02-06, last modified 2025-10-14
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