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Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing?

Bolzani Pöhls, Letícia (Corresponding author)^RWTH*

In
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) : May 3-5, 2023, Tallin, Estonia : proceedings / editors: Maksim Jenihhin (Tallinn University of Technology, Estonia), Hana Kubátová (Czech Technical University in Prague, Czech Republic), Nele Metens (KU Leuven/Leiden University, Belgium/Netherlands), Jaan Raik (Tallinn University of Technology, Estonia), Foisal Ahmed (Tallinn University of Technology, Estonia), Jan Bělohoubek (Czech Technical University in Prague, Czech Republic), Seiten/Artikel-Nr: 167-168

2023

Konferenz/Event:26. International Symposium on Design and Diagnostics of Electronic Circuits and Systems , Tallinn , Estonia , DDECS 2023 , 2023-05-03 - 2023-05-05

ImpressumPiscataway, NJ : IEEE

Umfang167-168

ISBN979-8-3503-3277-3, 979-8-3503-3278-0

Online
DOI: 10.1109/DDECS57882.2023.10139525
10.1109/DDECS57882.2023.10139525

Einrichtungen

1. Lehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf (611110)

Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
online, print

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85162211153
WOS Core Collection: WOS:001012062000032

Interne Identnummern
RWTH-2023-07700
Datensatz-ID: 963260

Beteiligte Länder
Germany