StUpPD_425-22
Study of Memristive Devices' Reliability considering PV and Operating Conditions
Grant period | 2022-10-01 -2023-09-30 |
Funding body | Exploratory Research Space der RWTH Aachen |
ERS | |
Identifier | G:(DE-82)EXS-SF-StUpPD_425-22 |
⇧ Start-Up for Juniorprofessor and Postdocs (EXS) ⇧
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Contribution to a book/Contribution to a conference proceedings
Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs
2024 IEEE 25th Latin American Test Symposium (LATS) : 9-12 April 2024 / publisher: IEEE ; [general co-chairs: Leticia Bolzani Poehls – RWTH Aachen, Germany; Yervant Zorian – Synopsys, USA ; publication co-chairs: Jarbas Silveira – UFC, Brazil; Thiago S. Copetti – RWTH Aachen, Germany]
IEEE 25. Latin American Test Symposium, LATS, MaceioMaceio, Brazil, 9 Apr 2024 - 12 Apr 2024
[Piscataway, NJ] : IEEE 6 Seiten (2024) [10.1109/LATS62223.2024.10534600]
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Journal Article
A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing
Journal of electronic testing : JETTA 40(2), 245-257 (2024) [10.1007/s10836-024-06108-8]
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Contribution to a book/Contribution to a conference proceedings
Evaluating a New RRAM Manufacturing Test Strategy
24th IEEE Latin American Test Symposium : Veracruz, Mexico, 21st-24th March 2023 / LATS 2023 ; general chair: Victor Champac (INAOE, Mexico), Yervant Zorian (Synopsys, USA) ; publication chair: Tiago Balen (UFRGS, Brazil) ; publisher: IEEE
IEEE 24. Latin American Test Symposium, LATS 2023, VeracruzVeracruz, Mexico, 21 Mar 2023 - 24 Mar 2023
[Piscataway, NJ] : IEEE, Latin American Test Workshop 6 Seiten (2023) [10.1109/LATS58125.2023.10154503]
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