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Evaluating a New RRAM Manufacturing Test Strategy

; ; ;

In
24th IEEE Latin American Test Symposium : Veracruz, Mexico, 21st-24th March 2023 / LATS 2023 ; general chair: Victor Champac (INAOE, Mexico), Yervant Zorian (Synopsys, USA) ; publication chair: Tiago Balen (UFRGS, Brazil) ; publisher: IEEE, Seiten/Artikel-Nr: 6 Seiten

Konferenz/Event:IEEE 24. Latin American Test Symposium , Veracruz , Mexico , LATS 2023 , 2023-03-21 - 2023-03-24

Impressum[Piscataway, NJ] : IEEE

Umfang6 Seiten

ISBN979-8-3503-2597-3, 979-8-3503-2598-0

ReiheLatin American Test Workshop

Online
DOI: 10.1109/LATS58125.2023.10154503


Einrichtungen

  1. Lehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf (611110)

Projekte

  1. StUpPD_425-22 - Study of Memristive Devices' Reliability considering PV and Operating Conditions (EXS-SF-StUpPD_425-22) (EXS-SF-StUpPD_425-22)
  2. ERS Start-Up (EXS) - Start-Up for Juniorprofessor and Postdocs (EXS-SU) (EXS-SU)
  3. EXS - Excellence Strategy (EXS) (EXS)


Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
online, print

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85164684957
WOS Core Collection: WOS:001017764900023

Interne Identnummern
RWTH-2023-07461
Datensatz-ID: 962553

Beteiligte Länder
Germany

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The record appears in these collections:
Document types > Events > Contributions to a conference proceedings
Document types > Books > Contributions to a book
Faculty of Electrical Engineering and Information Technology (Fac.6)
Public records
Publications database
611110
 Record created 2023-07-31, last modified 2025-04-16
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