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Characterization and Test of Intermittent Over RESET in RRAMs

Xun, Hanzhi (Corresponding author) ; Fieback, Moritz ; Yuan, Sicong ; Aziza, Hassen ; Heidekamp, Mathijs ; Santos Copetti, Thiago^RWTH* ; Poehls, Leticia Bolzani ; Taouil, Mottaqiallah ; Hamdioui, Said

In
Proceedings of the 2023 IEEE 32nd Asian Test Symposium : ATS 2023 : Beijing, China, 14-17 October 2023 / sponsored by: IEEE Council on Electronic Design Automation (CEDA), IEEE Computer Society Test Technology Technical Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in cooperation with: CCF Technical Committee on Integrated Circuit Design, CCF Technical Committee on Fault Tolerant Computing ; publisher: IEEE, Seiten/Artikel-Nr: 65-70

2023

Konferenz/Event:32. Asian Test Symposium , Beijing , Peoples R China , ATS 2023 , 2023-10-14 - 2023-10-17

Impressum[Piscataway, NJ] : IEEE

Umfang65-70

ISBN979-8-3503-0310-0, 979-8-3503-0311-7, 9798350303100, 9798350303117

Online
DOI: 10.1109/ATS59501.2023.10317990
10.1109/ATS59501.2023.10317990

Einrichtungen

1. Lehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf (611110)

Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
online, print

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85179179946
WOS Core Collection: WOS:001108557200012

Interne Identnummern
RWTH-2024-00906
Datensatz-ID: 977802

Beteiligte Länder
France, Germany, Netherlands