h1

h2

h3

h4

h5
h6
http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png

Lifecycle Management of Emerging Memories

;

In
2024 IEEE European Test Symposium (ETS), Seiten/Artikel-Nr: 6 Seiten

Konferenz/Event:29. IEEE European Test Symposium , The Hague , Netherlands , ETS 2024 , 2024-05-20 - 2024-05-24

: IEEE

Umfang6 Seiten

ISBN979-8-3503-4931-3, 979-8-3503-4932-0, 979-8-3503-4933-7

Datenträger: 1 USB-Stick

Online
DOI: 10.1109/ETS61313.2024.10567697


Einrichtungen

  1. Lehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf (611110)



Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
online, print, data medium

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85197530644
WOS Core Collection: WOS:001260970400037

Interne Identnummern
RWTH-2024-08136
Datensatz-ID: 992302

Beteiligte Länder
Germany, Netherlands

 GO

QR Code for this record

The record appears in these collections:
Document types > Events > Contributions to a conference proceedings
Document types > Books > Contributions to a book
Faculty of Electrical Engineering and Information Technology (Fac.6)
Public records
Publications database
611110
 Record created 2024-09-02, last modified 2024-09-04
Similar records



Rate this document:

Rate this document:
1
2
3
4
5
 
(Not yet reviewed)