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Exploring the use of extreme temperatures to facilitate fault propagation in ReRAMs
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In
Special Issue of Latin American Test Symposium 2024 / Edited by Dr. Leticia Maria Bolzani Poehls (RWTH Aachen University, Aachen, , Germany), Dr. Ernesto Sanchez (Polytechnic of Turin, Torino, , Italy), Dr. Yervant Zorian (No Organisation - Home based - 0614551, , , ), Dr. Tiago Balen (Federal University of Rio Grande do Sul, Aporto Alegre, , Brazil), Dr. Marcelo Lubaszewski (Universidade Federal do Rio Grande do Sul, Brazil, , , ), Prof. Dr. Cristina Meinhardt (Federal University of Santa Catarina, Florianopolis, , Brazil)
In
Microelectronics reliability 175, Seiten/Artikel-Nr.:115919
2025
Online
DOI: 10.1016/j.microrel.2025.115919
Einrichtungen
Projekte
Thematische Einordnung (Klassifikation)
DDC: 620
Dokumenttyp
Journal Article/Contribution to a conference proceedings
Format
online
Sprache
English
Anmerkung
Peer reviewed article
Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-105017115067
WOS Core Collection: WOS:001587518500001
Interne Identnummern
RWTH-2025-08710
Datensatz-ID: 1020000
Beteiligte Länder
Germany, Netherlands
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; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
| Typ | Amount | VAT | Currency | Share | Status | Cost centre |
| Other | 100.00 | 7.00 | EUR | 3.74 % | (DEAL) | 021000-611110 |
| Hybrid-OA | 2575.00 | 180.25 | EUR | 96.26 % | (DEAL) | 021000-611110 |
| Sum | 2675.00 | 187.25 | EUR | |||
| Total | 2862.25 |