Dynamic Compensation of Threshold-Voltage Shift in SiGe SB-FET for Operation in Ultra-wide Temperature Range

Beyer, Christoph; Trommer, Jens; Knoch, Joachim; Mikolajick, Thomas

doi:979-8-3503-9283-8

Dynamic Compensation of Threshold-Voltage Shift in SiGe SB-FET for Operation in Ultra-wide Temperature Range

Beyer, Christoph ; Mikolajick, Thomas ; Knoch, Joachim ; Trommer, Jens

In
Device Research Conference 2025 : workshop proceedings : date of conference: 22-25 June 2025; conference location: Durham, NC, USA / DRC, 83rd Device Research Conference, June 22-25, 2025, Duke University, Durham, North Carolina; sponsors and organizers: IEEE, Electron Devices Society, Nextron - Micro Probe System, NSF ; general chair: Saptarshi Das (Penn State University, USA)

2025

Konferenz/Event:2025 Device Research Conference , Durham, NC , USA , DRC , 2025-06-22 - 2025-06-25

ImpressumPiscataway, NJ, USA : IEEE

ISBN979-8-3503-9283-8, 979-8-3503-9284-5