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616210

Lehrstuhl für Halbleitertechnik und Institut für Halbleitertechnik
IDI:(DE-82)616210_20140620

⇧ RWTH Aachen ⇧

Recent Publications

All known publications ...
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http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;
Improvement of nanoscale line-edge roughness by conformal deposition
Journal of micromechanics and microengineering 36(7), 075016 () [10.1088/1361-6439/ae8b88]  GO OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;  ;
Mitigating the degradation of metal–semiconductor contacts with optimized electron beam evaporation
Micro and nano engineering 32, 100368 () [10.1016/j.mne.2026.100368]  GO OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Dissertation / PhD Thesis  ;  ;
Impact of dielectrics on the electronic properties of ultrasmall nanoscale silicon
Aachen : RWTH Aachen University 1 Online-Ressource : Illustrationen () [10.18154/RWTH-2025-10664] = Dissertation, Rheinisch-Westfälische Technische Hochschule Aachen, 2025  GO OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;  ;  ;  ;  ;  ;
Fabrication and characterization of InAs nanowire-based quantum dot structures utilizing buried bottom gates
Semiconductor science and technology 40(5), 055003 () [10.1088/1361-6641/adc9db]  GO OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article (Erratum/Correction)  ;
Analytical description of nanowires. III. Regular cross sections for Wurtzite structures. Corrigendum
Acta crystallographica / Section B 81(Part 2), 290-290 () [10.1107/S2052520625000873]  GO BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Contribution to a book/Contribution to a conference proceedings  ;  ;
Comparative Analysis of Canny and Watershed Edge Detection for Line-Edge Roughness (LER) Quantification in SEM Images
Proceedings of the 16th IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC 2025) : June 13-15, 2025, Yinchuan, Ningxia, China / publisher: Institute of Electrical and Electronics Engineers, Inc.
16. IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2025, Yinchuan, NingxiaYinchuan, Ningxia, Peoples R China, 025-06-12 - 15 Jun 2025025-06-122025-06-15 [Piscataway, NJ] : IEEE 144-147 () [10.1109/EDSSC64492.2025.11183035]  GO BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article (Letter)  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;  ;
Replacing Doping in Nano-Silicon: Ultimate Miniaturization, Energy Efficiency, and Cryo-Functionality
ACS applied materials & interfaces 17(37), 52325-52335 () [10.1021/acsami.5c08073]  GO BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article  ;  ;  ;  ;  ;  ;  ;  ;
Demonstration of Low Power and Multifunctional Neurons With Only Two or Five Ferroelectric SBFETs
IEEE transactions on electron devices : ED 73(2), 1034-1039 () [10.1109/TED.2025.3641606]  GO OpenAccess  Download fulltext Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Dissertation / PhD Thesis  ;  ;
Investigation of the release of hydrogen gas from PECVD thin films in cavities of MEMS sensors
Aachen x, 107 Seiten : Illustrationen () = Dissertation, Rheinisch-Westfälische Technische Hochschule Aachen, 2025  GO   Download fulltextTable of contents BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article (Erratum/Correction)
Erratum: “Number series of atoms, interatomic bonds and interface bonds defining zinc-blende nanocrystals as function of size, shape and surface orientation: Analytic tools to interpret solid state spectroscopy data” [AIP Adv. 6, 085306 (2016)]
AIP Advances 15(4), 049903 () [10.1063/5.0270948]  GO DBCoverage BibTeX | EndNote: XML, Text | RIS

All known publications ...
Download: BibTeX | EndNote XML,  Text | RIS | 

 Record created 2014-07-16, last modified 2022-01-21
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