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Predictive Reliability Modeling for NSFET Optimization—Part II: HCD and BTI

; ; ; ; ; ; ; ; ; ; ; ; ;

In
IEEE transactions on electron devices : ED

ImpressumNew York, NY : IEEE

ISSN0018-9383

Date of Publication: 13 April 2026

Online
DOI: 10.1109/TED.2026.3678529


Einrichtungen

  1. RWTH Aachen (hsbk000000)


Thematische Einordnung (Klassifikation)
DDC: 620


Dokumenttyp
Journal Article

Format
online

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-105036641713
WOS Core Collection: WOS:001743239800001

Interne Identnummern
RWTH-2026-04766
Datensatz-ID: 1034504

Beteiligte Länder
Belgium, Germany

Lizenzstatus der Zeitschrift

 GO

Medline ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
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The record appears in these collections:
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RWTH Aachen (no further subdivision)
Public records
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 Record created 2026-05-04, last modified 2026-05-08
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