In
Defect and impurity engineered semiconductors and devices III : symposium held [at the 2002 MRS spring meeting], April 1 - 5, 2002, San Francisco, California, U.S.A. / ed.: S. Ashok ..., Seiten/Artikel-Nr: 283-288
2002
Einrichtungen
Dokumenttyp
Contribution to a conference proceedings/Contribution to a book
Format
online, print
Sprache
English
Anmerkung
Peer reviewed article
Externe Identnummern
WOS Core Collection: WOS:000178622200041
Interne Identnummern
RWTH-CONV-178987
Datensatz-ID: 106607
Beteiligte Länder
Germany