h1

h2

h3

h4

h5
h6
http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png

2.5D EM small-signal analysis of MESFETs and HEMTs taking into account the full device metallisation geometry

;

In
Microwave and optical technology letters 8(4), Seiten/Artikel-Nr.:180-183

ImpressumNew York, NY [u.a.] : Wiley

ISSN0895-2477

Einrichtungen

  1. Lehrstuhl und Institut für Theoretische Elektrotechnik (611410)



Dokumenttyp
Journal Article

Format
online, print

Sprache
English

Anmerkung
Peer reviewed article

Interne Identnummern
RWTH-CONV-018367
Datensatz-ID: 137739

Lizenzstatus der Zeitschrift

 GO


QR Code for this record

The record appears in these collections:
Document types > Articles > Journal Articles
Faculty of Electrical Engineering and Information Technology (Fac.6)
Public records
Publications database
611410

 Record created 2013-01-28, last modified 2017-06-25



Rate this document:

Rate this document:
1
2
3
 
(Not yet reviewed)