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112430

⇧ RWTH Aachen ⇧

Recent Publications

All known publications ...
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http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Dissertation / PhD Thesis Ruzaeva, K.RWTH* ; Berkels, B. (Thesis advisor)RWTH* ; Berlage, T. L. (Thesis advisor)RWTH* ; Wiechert, W. (Thesis advisor)RWTH*
Geometry-aware image analysis for microfluidic live-cell experimentation
Aachen : RWTH Aachen University 1 Online-Ressource : Illustrationen (2025) [10.18154/RWTH-2025-03601]2025 = Dissertation, RWTH Aachen University, 2025     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article/Contribution to a conference proceedings Zhang, S. ; Zhou, X. ; Ahmad, S. ; Mathews, P. ; Hickel, T. ; Neugebauer, J. ; Alhassan, A. S. A.RWTH* ; Berkels, B.RWTH* ; Dehm, G. ; Scheu, C.
Triggering and tracking grain boundary phase transformation at atomic resolution
202417. European Microscopy Congress, EMC 2024, CopenhagenCopenhagen, Denmark, 24 Aug 2024 - 30 Aug 20242024-08-242024-08-30 BIO Web of Conferences 129, 23005 (2024) [10.1051/bioconf/202412923005] special issue: "The 17th European Microscopy Congress (EMC 2024) / Copenhagen, Denmark, August 25-30, 2024 / K. Qvortrup and K. Weede (eds.)"2024     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Felten, M. (First author)RWTH* ; Chaineux, V. F.RWTH* ; Zhang, S. ; Tehranchi, A. ; Hickel, T. ; Scheu, C. ; Spille, J.RWTH* ; Lipińska-Chwałek, M. ; Mayer, J.RWTH* ; Berkels, B.RWTH* ; Hans, M.RWTH* ; Greving, I. ; Flenner, S. ; Sefa, S. ; Zander, B. D. (Corresponding author)RWTH*
The effect of Laves phases and nano-precipitates on the electrochemical corrosion resistance of Mg-Al-Ca alloys under alkaline conditions
Journal of magnesium and alloys 12(6), 2447-2461 (2024) [10.1016/j.jma.2024.06.011]2024     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Saxena, A. ; Polin, N. ; Kusampudi, N. ; Katnagallu, S. ; Molina-Luna, L. ; Gutfleisch, O. ; Berkels, B.RWTH* ; Gault, B. ; Neugebauer, J. ; Freysoldt, C. (Corresponding author)
A Machine Learning Framework for Quantifying Chemical Segregation and Microstructural Features in Atom Probe Tomography Data
Microscopy and microanalysis 29(5), 1658-1670 (2023) [10.1093/micmic/ozad086]2023     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Ali Alhassan, A. S. A. (Corresponding author)RWTH* ; Zhang, S. ; Berkels, B.RWTH*
Direct motif extraction from high resolution crystalline STEM images
Ultramicroscopy 254, 113827 (2023) [10.1016/j.ultramic.2023.113827]2023   BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Dataset Medghalchi, S. (Corresponding author)RWTH* ; Karimi, E.RWTH* ; Lee, S.-H.RWTH* ; Berkels, B.RWTH* ; Kerzel, U. B.RWTH* ; Korte-Kerzel, S.RWTH*
Three-Dimensional Characterization of Deformation-induced Damage in Dual Phase Steel using Deep Learning
Zenodo (2023) [10.5281/ZENODO.8065752]2023   BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article/Contribution to a conference proceedings Medghalchi, S. (Corresponding author)RWTH* ; Karimi, E.RWTH* ; Lee, S.-H.RWTH* ; Berkels, B.RWTH* ; Kerzel, U. B.RWTH* ; Korte-Kerzel, S.RWTH*
Three-dimensional characterisation of deformation-induced damage in dual phase steel using deep learning
2023Nanomechanical Testing in Materials Research and Development VIII, SplitSplit, Croatia, 2 Oct 2022 - 7 Oct 20222022-10-022022-10-07 Materials and design 232, 112108 (2023) [10.1016/j.matdes.2023.112108] special issue: "Joint Special Issue on Nanomechanical Testing in Materials Research and Development VIII / Edited by Marco Sebastiani, Sandra Korte-Kerzel"2023     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Journal Article Luo, W.RWTH* ; Xie, Z. (Corresponding author)RWTH* ; Zhang, S. (Corresponding author) ; Guénolé, J. P. ; Sun, P.-L.RWTH* ; Meingast, A. ; Alhassan, A.RWTH* ; Zhou, X. ; Stein, F. ; Pizzagalli, L. ; Berkels, B.RWTH* ; Scheu, C. ; Korte-Kerzel, S. (Corresponding author)RWTH*
Tailoring the Plasticity of Topologically Close-Packed Phases via the Crystals’ Fundamental Building Blocks
Advanced materials 35(24), 2300586 (2023) [10.1002/adma.202300586]2023     Files BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Contribution to a book/Contribution to a conference proceedings Wolfschläger, D.RWTH* ; Yermakov, R.RWTH* ; Montavon, B. L.RWTH* ; Berkels, B.RWTH* ; Schmitt, R. H.RWTH*
Identifying the advantageous latent space dimensionality for StyleGANs used in industrial machine vision applications
2023AI and Optical Data Sciences IV : 30 January-2 February 2023, San Francisco, California, United States / Bahram Jalali, Ken-ichi Kitayama (editors) ; sponsored and published by: SPIE
AI and Optical Data Sciences IV, San FranciscoSan Francisco, USA, 28 Jan 2023 - 3 Feb 20232023-01-282023-02-03 Bellingham, Washington, USA : SPIE, Proceedings of SPIE 12438, (2023) [10.1117/12.2646326]2023   BibTeX | EndNote: XML, Text | RIS

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Contribution to a book/Contribution to a conference proceedings Ruzaeva, K. (Corresponding author)RWTH* ; Cohrs, J.-C. (Corresponding author)RWTH* ; Kasahara, K. (Corresponding author) ; Kohlheyer, D. (Corresponding author) ; Nöh, K. (Corresponding author) ; Berkels, B. (Corresponding author)RWTH*
Cell tracking for live-cell microscopy using an activity-prioritized assignment strategy
20222022 IEEE 5th International Image Processing, Applications and Systems Conference
IEEE 5. International Conference on Image Processing Applications and Systems, IPAS 2022, GenovaGenova, Italy, 5 Dec 2022 - 7 Dec 20222022-12-052022-12-07 Piscataway, NJ : IEEE 7 Seiten (2022) [10.1109/IPAS55744.2022.10053036]2022   BibTeX | EndNote: XML, Text | RIS

All known publications ...
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