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Impact of aging on the SEU immunity of FinFET-based embedded memory systems
; ; ; ;
In
Special issue of 34th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2023 / Edited by: Nathalie, Labat; Nolhier, Nicolas
In
Microelectronics reliability 150, Seiten/Artikel-Nr.:115229
2023
Online
DOI: 10.1016/j.microrel.2023.115229
Einrichtungen
Thematische Einordnung (Klassifikation)
DDC: 620
Dokumenttyp
Journal Article/Contribution to a conference proceedings
Format
online, print
Sprache
English
Anmerkung
Peer reviewed article
Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85174678665
WOS Core Collection: WOS:001106932400001
Interne Identnummern
RWTH-2023-11970
Datensatz-ID: 975292
Beteiligte Länder
Brazil, Germany, Mexico
; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
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