Invited Paper: A Holistic Fault Injection Platform for Neuromorphic Hardware

Staudigl, Felix; Pelke, Rebecca; Fetz, Thorben; Bolzani Pöhls, Letícia; Joseph, Jan Moritz; Sisejkovic, Dominik; Leupers, Rainer

doi:979-8-3503-2598-0

Invited Paper: A Holistic Fault Injection Platform for Neuromorphic Hardware

Staudigl, Felix (Corresponding author)^RWTH* ; Fetz, Thorben (Corresponding author)^RWTH* ; Pelke, Rebecca (Corresponding author)^RWTH* ; Sisejkovic, Dominik (Corresponding author) ; Joseph, Jan Moritz (Corresponding author)^RWTH* ; Bolzani Pöhls, Letícia (Corresponding author)^RWTH* ; Leupers, Rainer (Corresponding author)^RWTH*

In
24th IEEE Latin American Test Symposium : Veracruz, Mexico, 21st-24th March 2023 / LATS 2023 ; general chair: Victor Champac (INAOE, Mexico), Yervant Zorian (Synopsys, USA) ; publication chair: Tiago Balen (UFRGS, Brazil) ; publisher: IEEE, Seiten/Artikel-Nr: 6 Seiten

2023

Konferenz/Event:IEEE 24. Latin American Test Symposium , Veracruz , Mexico , LATS 2023 , 2023-03-21 - 2023-03-24

Impressum[Piscataway, NJ] : IEEE

Umfang6 Seiten

ISBN979-8-3503-2597-3, 979-8-3503-2598-0