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Nanoscale Infrared Spectroscopic Characterization of Extended Defects in 4H-Silicon Carbide

; ; ; ; ; ; ; ; ;

In
Nano letters 24(1), Seiten/Artikel-Nr.:114-121

ImpressumWashington, DC : ACS Publ.

ISSN1530-6992

Online
DOI: 10.1021/acs.nanolett.3c03369


Einrichtungen

  1. Lehr- und Forschungsgebiet Metamaterialien und Nano-Optik (136720)
  2. Fachgruppe Physik (130000)


Thematische Einordnung (Klassifikation)
DDC: 660


Dokumenttyp
Journal Article

Format
online, print

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85181575486
WOS Core Collection: WOS:001140843300001
PubMed: pmid:38164942

Interne Identnummern
RWTH-2024-04048
Datensatz-ID: 984466

Beteiligte Länder
Canada, Germany, USA

 GO

Medline ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF >= 10 ; JCR ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
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The record appears in these collections:
Document types > Articles > Journal Articles
Faculty of Mathematics, Computer Science and Natural Sciences (Fac.1) > Department of Physics
Public records
Publications database
136720
130000
 Record created 2024-04-12, last modified 2024-12-14
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