Müller, D. (Corresponding author) ; Chiodo, M. ; Franklin, J.
Science and engineering ethics 28(5), Seiten/Artikel-Nr.:41
DOI: 10.1007/s11948-022-00389-y
Verneuer-Emre, L. M. ; Eifler, S. ; Dülmer, H.
Methods, data, analyses : mda 16(2), Seiten/Artikel-Nr.:133-140
DOI: 10.18154/RWTH-2022-08645
Divincenzo, D. ; Viola, G.
URL: https://worldwide.espacenet.com/patent/search/family/052103022/publication/DE102013018011B4?q=DE102013018011%20B4
Jaskiewicz, M. ; Conradt, U.
URL: https://worldwide.espacenet.com/patent/search/family/048626341/publication/EP3010329B1?q=EP3010329%20B1
Barth, S. ; Fitting, J. ; Tur, M. K.
URL: https://worldwide.espacenet.com/patent/search/family/048703357/publication/EP3016983B1?q=EP3016983%20B1
Muthukaruppan, A. ; Petry, H. G. ; Nataraj, T.
URL: https://worldwide.espacenet.com/patent/search/family/067224049/publication/DE102019104329A1?q=DE102019104329
Lakshmanan, M. A. ; Adomeit, M. A. ; Seefeldt, P. ; Reimer, V.
URL: https://worldwide.espacenet.com/patent/search/family/052780549/publication/EP3126245B1?q=pn%3DEP3126245B1
Liebich, S. ; Fabry, J. ; Brandis, R.
URL: https://worldwide.espacenet.com/patent/search/family/075143613/publication/DE102020107620B3?q=DE102020107620%20B3
Haasler, D. ; Finger, J.
URL: https://worldwide.espacenet.com/patent/search/family/074586983/publication/DE102020201207A1?q=DE102020201207%20A1
Vernaleken, A. ; Rußbüldt, P. ; Sartorius, T. ; Schulte, J.-F. ; ; et al
URL: https://worldwide.espacenet.com/patent/search/family/053175515/publication/DE102014007159B4?q=pn%3DDE102014007159B4
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