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Electric field strength-dependent accuracy of TiAlN thin film composition measurements by laser-assisted atom probe tomography

;

In
New journal of physics 22, Seiten/Artikel-Nr.:033036

Impressum[Bad Honnef] : Dt. Physikalische Ges.

Umfang[1]-9

ISSN1367-2630

Online
DOI: 10.18154/RWTH-2020-03683
DOI: 10.1088/1367-2630/ab7770

URL: https://publications.rwth-aachen.de/record/786777/files/786777.pdf

Einrichtungen

  1. Lehrstuhl für Werkstoffchemie (521110)
  2. Fachgruppe Materialwissenschaft und Werkstofftechnik (520000)
  3. StrucMatLab (520001)


Thematische Einordnung (Klassifikation)
DDC: 530

OpenAccess:
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Dokumenttyp
Journal Article

Format
online

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
WOS Core Collection: WOS:000522286900001
SCOPUS: SCOPUS:2-s2.0-85083292921

Interne Identnummern
RWTH-2020-03683
Datensatz-ID: 786777

Beteiligte Länder
Germany

Lizenzstatus der Zeitschrift

 GO

Medline ; Creative Commons Attribution CC BY 4.0 ; DOAJ ; OpenAccess ; Clarivate Analytics Master Journal List ; Current Contents - Physical, Chemical and Earth Sciences ; DOAJ Seal ; Ebsco Academic Search ; IF < 5 ; JCR ; NationallizenzNationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Web of Science Core Collection
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 Record created 2020-03-26, last modified 2025-10-15
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