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A Robust Algorithm for Microscopic Simulation of Avalanche Breakdown in Semiconductor Devices
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In
IEEE transactions on electron devices 62(8), Seiten/Artikel-Nr.:2614-2619
2015
Online
DOI: 10.1109/TED.2015.2446132
URL: http://publications.rwth-aachen.de/record/481496/files/07154415.pdf?subformat=pdfa
URL: http://publications.rwth-aachen.de/record/481496/files/07154415.pdf
Einrichtungen
Projekte
Thematische Einordnung (Klassifikation)
DDC: 620
Open Access: 
PDF (PDFA)
OpenAccess: 
PDF
Dokumenttyp
Journal Article
Format
online, print
Sprache
English
Anmerkung
Peer reviewed article
Externe Identnummern
INSPEC: 15306310
SCOPUS: SCOPUS:2-s2.0-85027930896
WOS Core Collection: WOS:000358507600037
Interne Identnummern
RWTH-2015-04170
Datensatz-ID: 481496
Beteiligte Länder
Germany
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; Current Contents - Engineering, Computing and Technology ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection
| Typ | Amount | VAT | Currency | Share | Status | Cost centre |
| Hybrid-OA | 1770.00 | 0.00 | USD | 100.00 % | (Voucher) | 021000 |
| Sum | 1770.00 | 0.00 | (see parts above) | |||
| Total | 1770.00 |