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A Combined Strategy for Testing RRAMs After Manufacturing and During Lifetime

; ;

In
2025 IEEE 26th Latin American Test Symposium (LATS) : 11-14 March 2025; conference location: San Andrés Islas, Colombia / publisher: IEEE ; [general co-chairs: Ernesto Sanchez – Politecnico di Torino, Italy; Yervant Zorian – Synopsys, USA ; publication co-chairs: Thiago S. Copetti – RWTH Aachen, Germany], Seiten/Artikel-Nr: 6 Seiten

Konferenz/Event:IEEE 26. Latin American Test Symposium , San Andres Islas , Colombia , LATS 2025 , 2025-03-11 - 2025-03-14

Impressum[Piscataway, NJ] : IEEE

Umfang6 Seiten

ISBN978-1-6654-7763-5, 978-1-6654-7764-2, 978-1-66547-763-5, 978-1-66547-764-2

Online
DOI: 10.1109/LATS65346.2025.10963957


Einrichtungen

  1. Lehrstuhl für Integrierte digitale Systeme und Schaltungsentwurf (611110)



Dokumenttyp
Contribution to a book/Contribution to a conference proceedings

Format
online, print

Sprache
English

Anmerkung
Peer review status of article unknown

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-105004731721
WOS Core Collection: WOS:001480998600023

Interne Identnummern
RWTH-2025-06139
Datensatz-ID: 1014543

Beteiligte Länder
Germany

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The record appears in these collections:
Document types > Events > Contributions to a conference proceedings
Document types > Books > Contributions to a book
Faculty of Electrical Engineering and Information Technology (Fac.6)
Public records
Publications database
611110
 Record created 2025-07-14, last modified 2025-07-15
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