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Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements

; ; ; ; ; ;

In
Applied surface science 107(22), Seiten/Artikel-Nr.:6612-6617

ImpressumAmsterdam [u.a.] : Elsevier

ISSN0169-4332

Online
DOI: 10.1016/j.apsusc.2010.04.057


Einrichtungen

  1. Lehrstuhl für Experimentalphysik I A und I. Physikalisches Institut (131110)
  2. Fachgruppe Physik (130000)



Dokumenttyp
Journal Article

Format
online, print

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
WOS Core Collection: WOS:000278908900021
SCOPUS: SCOPUS:2-s2.0-77955660813

Interne Identnummern
RWTH-CONV-046447
Datensatz-ID: 168810

Beteiligte Länder
Germany

Lizenzstatus der Zeitschrift

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The record appears in these collections:
Document types > Articles > Journal Articles
Faculty of Mathematics and Natural Sciences (Fac.1) > Department of Physics
Public records
Publications database
130000
131110
 Record created 2013-01-28, last modified 2021-09-22
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