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Lattice Deformation at Submicron Scale : X-Ray Nanobeam Measurements of Elastic Strain in Electron Shuttling Devices

; ; ; ; ; ; ; ; ; ; ; ; ;

In
Physical review applied 20(2), Seiten/Artikel-Nr.:024056

ImpressumCollege Park, Md. [u.a.] : American Physical Society

Umfang1-12

ISSN2331-7019

Online
DOI: 10.18154/RWTH-2024-03271
DOI: 10.1103/PhysRevApplied.20.024056

URL: https://publications.rwth-aachen.de/record/983205/files/983205.pdf

Einrichtungen

  1. Lehrstuhl für Experimentalphysik und II. Physikalisches Institut (132210)
  2. Fachgruppe Physik (130000)
  3. JARA-FIT (080009)


Thematische Einordnung (Klassifikation)
DDC: 530

OpenAccess:
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Dokumenttyp
Journal Article

Format
online

Sprache
English

Anmerkung
Peer reviewed article

Externe Identnummern
SCOPUS: SCOPUS:2-s2.0-85172904581
WOS Core Collection: WOS:001256508500001

Interne Identnummern
RWTH-2024-03271
Datensatz-ID: 983205

Beteiligte Länder
France, Germany, Italy

 GO

Creative Commons Attribution CC BY 4.0 ; OpenAccess
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Faculty of Mathematics and Natural Sciences (Fac.1) > Department of Physics
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080009
130000
132210
 Record created 2024-03-15, last modified 2025-10-07
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